Applied to high and low temperature testing of semiconductor equipment. Cold and heat sources for high and low temperature, constant temperature testing of electronic equipment;

Independent refrigeration cycle fan unit;

Continuous long-term operation with automatic defrosting that does not affect storage chamber temperature;

Modular design facilitates easy replacement of standby units (only one standby unit is required);

Prevent frosting of the evaporation system caused by frequent door opening and closing; the defrosting process of the evaporation system has no impact on the storage temperature ;